[IISE Faculty List] The first issue of Journal of Quality Technology in 2025

[Rong Pan]

I am pleased to announce that the first issue of Journal of Quality Technology (JQT) in 2025 is now available online at the publisher, Taylor & Francis, website: https://nam12.safelinks.protection.outlook.com/?url=https%3A%2F%2Fwww.tandfonline.com%2Ftoc%2Fujqt20%2Fcurrent&data=05%7C02%7Ciefac.list%40mailman.clemson.edu%7Cf6298ad2856c4bbf82bd08dd2e6bc70d%7C0c9bf8f6ccad4b87818d49026938aa97%7C0%7C0%7C638717762633932364%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=Y8zXOGSN5K84zDFyq%2Bj4Ru3K3zdwpnbMzAK7r2AwDAY%3D&reserved=0.
The articles, including regular papers, case reports, and software, collected in this issue are:
Capezza, C., Capizzi, G., Centofanti, F., Lepore, A., & Palumbo, B. (2025). An adaptive multivariate functional EWMA control chart. Journal of Quality Technology, 57(1), 1-15. https://nam12.safelinks.protection.outlook.com/?url=https%3A%2F%2Fdoi.org%2F10.1080%2F00224065.2024.238367456&data=05%7C02%7Ciefac.list%40mailman.clemson.edu%7Cf6298ad2856c4bbf82bd08dd2e6bc70d%7C0c9bf8f6ccad4b87818d49026938aa97%7C0%7C0%7C638717762633956601%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=pEejKKduI6N72E%2BDhqOTh8wbqGREVD5m9qTrBJEhib4%3D&reserved=0
Sürer, Ö. (2025). Simulation experiment design for calibration via active learning. Journal of Quality Technology, 57(1), 16-34. https://nam12.safelinks.protection.outlook.com/?url=https%3A%2F%2Fdoi.org%2F10.1080%2F00224065.2024.23917801112&data=05%7C02%7Ciefac.list%40mailman.clemson.edu%7Cf6298ad2856c4bbf82bd08dd2e6bc70d%7C0c9bf8f6ccad4b87818d49026938aa97%7C0%7C0%7C638717762633972703%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=WA%2FFG2lu1ARN0slHtfjPcqYETQ%2FLhLc6o%2FzfX8R0u%2Fs%3D&reserved=0
Shi, J., Kang, Y., Pu, L., & Xiang, D. (2025). A unified framework for high-dimensional data stream analysis in fault diagnosis. Journal of Quality Technology, 57(1), 35-50. https://nam12.safelinks.protection.outlook.com/?url=https%3A%2F%2Fdoi.org%2F10.1080%2F00224065.2024.239386934&data=05%7C02%7Ciefac.list%40mailman.clemson.edu%7Cf6298ad2856c4bbf82bd08dd2e6bc70d%7C0c9bf8f6ccad4b87818d49026938aa97%7C0%7C0%7C638717762633984291%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=%2FaC5%2F4An575Mfo38IwtDLwD2aejw4jZk7CRGsmg%2Bh2w%3D&reserved=0
Zhuang, L., Xu, A., Fang, G., & Tang, Y. (2025). Multivariate reparameterized inverse Gaussian processes with common effects for degradation-based reliability prediction. Journal of Quality Technology, 57(1), 51-67. https://nam12.safelinks.protection.outlook.com/?url=https%3A%2F%2Fdoi.org%2F10.1080%2F00224065.2024.2402850910&data=05%7C02%7Ciefac.list%40mailman.clemson.edu%7Cf6298ad2856c4bbf82bd08dd2e6bc70d%7C0c9bf8f6ccad4b87818d49026938aa97%7C0%7C0%7C638717762633995685%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=yn4%2F24%2FKDXHkfkVBZ87A%2BaxdPMFUsuISC13iWwd8Zo8%3D&reserved=0
Maboudou-Tchao, E. M., & Hampton, H. D. (2025). Deep least squares one-class classification. Journal of Quality Technology, 57(1), 68-92. https://nam12.safelinks.protection.outlook.com/?url=https%3A%2F%2Fdoi.org%2F10.1080%2F00224065.2024.242116478&data=05%7C02%7Ciefac.list%40mailman.clemson.edu%7Cf6298ad2856c4bbf82bd08dd2e6bc70d%7C0c9bf8f6ccad4b87818d49026938aa97%7C0%7C0%7C638717762634011372%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=KB%2F1RxsXYuZlFJmnExFoa4yAm06ar1cllOaq19A1v90%3D&reserved=0
Song, X., Odongo, K., Pascual, F. G., & Hong, Y. (2025). A comprehensive case study on the performance of machine learning methods on the classification of solar panel electroluminescence images. Journal of Quality Technology, 57(1), 93-109. https://nam12.safelinks.protection.outlook.com/?url=https%3A%2F%2Fdoi.org%2F10.1080%2F00224065.2024.239460412&data=05%7C02%7Ciefac.list%40mailman.clemson.edu%7Cf6298ad2856c4bbf82bd08dd2e6bc70d%7C0c9bf8f6ccad4b87818d49026938aa97%7C0%7C0%7C638717762634028643%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=fp17exPZyTLYbCO7JWyMYT%2BWmCTNY6AXL12BoxPkMgk%3D&reserved=0
These articles collectively advance the fields of quality and reliability engineering by introducing innovative methods for: defect detection in solar panels, fault diagnosis in high-dimensional data streams, statistical process monitoring, one-class classification, reliability prediction, and simulation experiment design.
JQT is an ASQ flagship publication aiming to contribute to the technical advancement of the field of quality technology by publishing papers that emphasize the methodological development of novel quality and reliability improvement techniques and their practical applicability in industry, service, military, and government operations. It seeks to publish research that applies innovative thinking and develops cutting-edge statistical, analytical, and computational methods to address real problems related to Quality Technology. I welcome you to consider publishing your latest relevant work in JQT. In addition, the journal is accepting submissions to an AI special issue. For more information on this special issue, please visit  https://nam12.safelinks.protection.outlook.com/?url=https%3A%2F%2Fthink.taylorandfrancis.com%2Fspecial_issues%2Ffuture-quality-technology-artificial-intelligence%2F&data=05%7C02%7Ciefac.list%40mailman.clemson.edu%7Cf6298ad2856c4bbf82bd08dd2e6bc70d%7C0c9bf8f6ccad4b87818d49026938aa97%7C0%7C0%7C638717762634040712%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=GeyJc3PfCQmEclnenn1Fqc3esGX9djEjHu7YfKE3uxE%3D&reserved=0.

Rong Pan
JQT Editor

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