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<p class="MsoNormal"><span style="font-family:"Times New Roman",serif">I am pleased to announce that the first issue of Journal of Quality Technology (JQT) in 2025 is now available online at the publisher, Taylor & Francis, website:
</span><a href="https://nam12.safelinks.protection.outlook.com/?url=https%3A%2F%2Fwww.tandfonline.com%2Ftoc%2Fujqt20%2Fcurrent&data=05%7C02%7Ciefac.list%40mailman.clemson.edu%7Cf6298ad2856c4bbf82bd08dd2e6bc70d%7C0c9bf8f6ccad4b87818d49026938aa97%7C0%7C0%7C638717762634073111%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=4vyOJQH6MQR%2B%2BDhBvZP0P3Ca9u62zAcLdBsl89jn6C4%3D&reserved=0" originalSrc="https://www.tandfonline.com/toc/ujqt20/current" shash="PGSOSFdNeHDaga7nSnqmTlZ5YCJM/QVYvsEQX/J31APIwzvYpu8ZflpxIhhBIMLVzXFuIvDJBBYcYFN/Nlpq+sfCD5sSAFzDCXaURl4E0oJy2CZ5PfAU1g7kK15o6kcvIUBag3/vv1Pe6dOJDQ7rzcQZy5QV+k1Gd88kG8mZRP8="><span style="font-family:"Times New Roman",serif">https://www.tandfonline.com/toc/ujqt20/current</span></a><span style="font-family:"Times New Roman",serif">.<o:p></o:p></span></p>
<p class="MsoNormal"><span style="font-family:"Times New Roman",serif">The articles, including regular papers, case reports, and software, collected in this issue are:<o:p></o:p></span></p>
<p class="MsoNormal"><span style="font-family:"Times New Roman",serif">Capezza, C., Capizzi, G., Centofanti, F., Lepore, A., & Palumbo, B. (2025). An adaptive multivariate functional EWMA control chart.
<i>Journal of Quality Technology</i>, <i>57</i>(1), 1-15. <a href="https://nam12.safelinks.protection.outlook.com/?url=https%3A%2F%2Fdoi.org%2F10.1080%2F00224065.2024.238367456&data=05%7C02%7Ciefac.list%40mailman.clemson.edu%7Cf6298ad2856c4bbf82bd08dd2e6bc70d%7C0c9bf8f6ccad4b87818d49026938aa97%7C0%7C0%7C638717762634086684%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=8qwZj3a%2BOlIRAAGUFecDXe5Hn2eFvPKOFRNeUHpkM14%3D&reserved=0" originalSrc="https://doi.org/10.1080/00224065.2024.238367456" shash="AKooloGmVu4Ql58Ku0zEb0CGwcbUCnSYZlQF61x9wiaCoLLPZO0NPjnwCyW7iIWTCE1GeShrumLt+Qk7O+RbZbaRO/1nGta7SXAJjaGdKvEybNaHlKw+4hCLHtH/SpV7NK5cnB4JutmD+NllX3BvVk3dJcbxpxJwvpAux5fK3OA=">
https://doi.org/10.1080/00224065.2024.238367456</a><o:p></o:p></span></p>
<p class="MsoNormal"><span style="font-family:"Times New Roman",serif">Sürer, Ö. (2025). Simulation experiment design for calibration via active learning.
<i>Journal of Quality Technology</i>, <i>57</i>(1), 16-34. <a href="https://nam12.safelinks.protection.outlook.com/?url=https%3A%2F%2Fdoi.org%2F10.1080%2F00224065.2024.23917801112&data=05%7C02%7Ciefac.list%40mailman.clemson.edu%7Cf6298ad2856c4bbf82bd08dd2e6bc70d%7C0c9bf8f6ccad4b87818d49026938aa97%7C0%7C0%7C638717762634099429%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=ufnVAIWpqDwdJ5qyvo6Ykq3kfNQRc1vP3iST3w54xBw%3D&reserved=0" originalSrc="https://doi.org/10.1080/00224065.2024.23917801112" shash="MHLWBfii0GnMr96U6EU2RVqoFunwQlNWQqvKCuC11tShCPCxirRO+kqXwxvMDv6rJXpSpetiRJW9uLG+xfv0xEAn+RfTxb+cfLugfjNg3aoyox0UbalyWPjfY3eG01p1xJaXNnwV0OizQyfrXDIKHYMh43KWawmF5o5A487WMLA=">
https://doi.org/10.1080/00224065.2024.23917801112</a><o:p></o:p></span></p>
<p class="MsoNormal"><span style="font-family:"Times New Roman",serif">Shi, J., Kang, Y., Pu, L., & Xiang, D. (2025). A unified framework for high-dimensional data stream analysis in fault diagnosis.
<i>Journal of Quality Technology</i>, <i>57</i>(1), 35-50. <a href="https://nam12.safelinks.protection.outlook.com/?url=https%3A%2F%2Fdoi.org%2F10.1080%2F00224065.2024.239386934&data=05%7C02%7Ciefac.list%40mailman.clemson.edu%7Cf6298ad2856c4bbf82bd08dd2e6bc70d%7C0c9bf8f6ccad4b87818d49026938aa97%7C0%7C0%7C638717762634112114%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=0ziWsX%2FRc0Pfh3B6UmCu4hboJ%2B0FswAW2qUvBdeQa2s%3D&reserved=0" originalSrc="https://doi.org/10.1080/00224065.2024.239386934" shash="yn25IBE4eILXucUH7llf67xE7dzKktuWr2Ovj4EI92V8APM39Qx+ndBFm4Qwh0vWXe0WysaxWmxjmY9uW7iCL5UWWNwi+BRMaREfnnu7w4zX7CDUhl+cOnNguasVD1YZGDUMrvWL/VGzQaQHc1I2lp9J1wDwaIAbOoMqU+xyLgg=">
https://doi.org/10.1080/00224065.2024.239386934</a><o:p></o:p></span></p>
<p class="MsoNormal"><span style="font-family:"Times New Roman",serif">Zhuang, L., Xu, A., Fang, G., & Tang, Y. (2025). Multivariate reparameterized inverse Gaussian processes with common effects for degradation-based reliability prediction.
<i>Journal of Quality Technology</i>, <i>57</i>(1), 51-67. <a href="https://nam12.safelinks.protection.outlook.com/?url=https%3A%2F%2Fdoi.org%2F10.1080%2F00224065.2024.2402850910&data=05%7C02%7Ciefac.list%40mailman.clemson.edu%7Cf6298ad2856c4bbf82bd08dd2e6bc70d%7C0c9bf8f6ccad4b87818d49026938aa97%7C0%7C0%7C638717762634124534%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=81jtS30T4tqudgfS7ekCSZX6ULpz9yXOCm8iSO%2B4VzA%3D&reserved=0" originalSrc="https://doi.org/10.1080/00224065.2024.2402850910" shash="xgEnJlLrS+63diG2UlLtWm5eJ2gsKYqICJo088bUnn8TDXem/f6wgpwB3oFsHafpBZqTFAzffC/18iNk0mcaNKjUCMEOtTK+2HjfGlVrbd0N4kzk4yxhnfrT+SYd7M1uldyzFNAR0l/fNTShYpdF2/COZd501WFP0KGcFvZeNXQ=">
https://doi.org/10.1080/00224065.2024.2402850910</a><o:p></o:p></span></p>
<p class="MsoNormal"><span style="font-family:"Times New Roman",serif">Maboudou-Tchao, E. M., & Hampton, H. D. (2025). Deep least squares one-class classification.
<i>Journal of Quality Technology</i>, <i>57</i>(1), 68-92. <a href="https://nam12.safelinks.protection.outlook.com/?url=https%3A%2F%2Fdoi.org%2F10.1080%2F00224065.2024.242116478&data=05%7C02%7Ciefac.list%40mailman.clemson.edu%7Cf6298ad2856c4bbf82bd08dd2e6bc70d%7C0c9bf8f6ccad4b87818d49026938aa97%7C0%7C0%7C638717762634137049%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=ijOZ1MzkmdbbIWwCTj%2F895oqtJj1scqiTgiQZMc3EuY%3D&reserved=0" originalSrc="https://doi.org/10.1080/00224065.2024.242116478" shash="l6Jy3jmlX8b1qv+OixXCzicqFuTHzr1gf1Bze80fJ3oUADSTIBlPviW1ZqmEMPCdgwOcyfZo02cbjhbRREGzGitrd5KI+CLIAXQPJkdYe2xnKH2ZAj7B+7uDNNCSkP8t1S8R/rlJChCb02A0m8OHXCUrczKcTs9yACdrBtZ09jc=">
https://doi.org/10.1080/00224065.2024.242116478</a><o:p></o:p></span></p>
<p class="MsoNormal"><span style="font-family:"Times New Roman",serif">Song, X., Odongo, K., Pascual, F. G., & Hong, Y. (2025). A comprehensive case study on the performance of machine learning methods on the classification of solar panel electroluminescence
images. <i>Journal of Quality Technology</i>, <i>57</i>(1), 93-109. <a href="https://nam12.safelinks.protection.outlook.com/?url=https%3A%2F%2Fdoi.org%2F10.1080%2F00224065.2024.239460412&data=05%7C02%7Ciefac.list%40mailman.clemson.edu%7Cf6298ad2856c4bbf82bd08dd2e6bc70d%7C0c9bf8f6ccad4b87818d49026938aa97%7C0%7C0%7C638717762634149522%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=Sd4Xz1BCdo29REP2mP4ZdKBYnCR7rO3ck8n72wWGgsQ%3D&reserved=0" originalSrc="https://doi.org/10.1080/00224065.2024.239460412" shash="hFcp0qEkDJMZ5l4e73KpYw8vxpGYBfTAUMd+SCx5sk1hUOUsFvB56CQOd3bpZXG7jJJYA6hVEVkDDRZIBKbjJSlKxPOQR3HYw3pycmGZL4Eq+jCu09l/d8SMicm86BxCyMu4LzRSp5gvzq8T7mtUIepqxS5LXgthlLBeqU226Wc=">
https://doi.org/10.1080/00224065.2024.239460412</a><o:p></o:p></span></p>
<p class="MsoNormal"><span style="font-family:"Times New Roman",serif">These articles collectively advance the fields of quality and reliability engineering by introducing innovative methods for: defect detection in solar panels, fault diagnosis in high-dimensional
data streams, statistical process monitoring, one-class classification, reliability prediction, and simulation experiment design.
<o:p></o:p></span></p>
<p class="MsoNormal" style="margin-bottom:0in;line-height:normal"><span style="font-family:"Times New Roman",serif;color:#333333;mso-ligatures:none">JQT is an ASQ flagship publication aiming to contribute to the technical advancement of the field of quality
technology by publishing papers that emphasize the methodological development of novel quality and reliability improvement techniques and their practical applicability in industry, service, military, and government operations. It seeks to publish research
that applies innovative thinking and develops cutting-edge statistical, analytical, and computational methods to address real problems related to Quality Technology. I welcome you to consider publishing your latest relevant work in JQT. In addition, the journal
is accepting submissions to an AI special issue. For more information on this special issue, please visit
</span><a href="https://nam12.safelinks.protection.outlook.com/?url=https%3A%2F%2Fthink.taylorandfrancis.com%2Fspecial_issues%2Ffuture-quality-technology-artificial-intelligence%2F&data=05%7C02%7Ciefac.list%40mailman.clemson.edu%7Cf6298ad2856c4bbf82bd08dd2e6bc70d%7C0c9bf8f6ccad4b87818d49026938aa97%7C0%7C0%7C638717762634163510%7CUnknown%7CTWFpbGZsb3d8eyJFbXB0eU1hcGkiOnRydWUsIlYiOiIwLjAuMDAwMCIsIlAiOiJXaW4zMiIsIkFOIjoiTWFpbCIsIldUIjoyfQ%3D%3D%7C0%7C%7C%7C&sdata=9aCFgjqM2SL9ro3FoWeK9iogpiH28G%2B3BcOBAr33pi4%3D&reserved=0" originalSrc="https://think.taylorandfrancis.com/special_issues/future-quality-technology-artificial-intelligence/" shash="iwGlqNJL9MRHkPRitR+nZynOoOTJpZarmTAjlwBAPOT9HcRd8aYz07I5WPMI3VXanpN46TRHJByLqjObxeCKhGuBh5q4GpeZk+9vyDgXfAyyOuwzmCWIgc5yKeV267l7mpWM4W/7oBPthu+x/TISJAupyG2HHua9MnSrk5gTLCA="><span style="font-family:"Times New Roman",serif;mso-ligatures:none">https://think.taylorandfrancis.com/special_issues/future-quality-technology-artificial-intelligence/</span></a><span style="font-family:"Times New Roman",serif;color:#333333;mso-ligatures:none">.
<o:p></o:p></span></p>
<p class="MsoNormal" style="margin-bottom:0in;line-height:normal"><span style="font-family:"Times New Roman",serif;color:#333333;mso-ligatures:none"><o:p> </o:p></span></p>
<p class="MsoNormal" style="margin-bottom:0in;line-height:normal"><span style="font-family:"Times New Roman",serif;color:#333333;mso-ligatures:none">Rong Pan<o:p></o:p></span></p>
<p class="MsoNormal" style="margin-bottom:0in;line-height:normal"><span style="font-family:"Times New Roman",serif;color:#333333;mso-ligatures:none">JQT Editor<o:p></o:p></span></p>
<p class="MsoNormal"><span style="font-size:11.0pt;line-height:115%;font-family:"Arial",sans-serif"><o:p> </o:p></span></p>
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