[Iefac.list] Call for Papers: 2017 IISE Annual Conference - QCRE Division

Paynabar, Kamran kamran.paynabar at isye.gatech.edu
Wed Sep 21 09:24:24 EDT 2016


Dear colleagues,

The Quality Control and Reliability Engineering (QCRE) division of the Institute of Industrial and Systems Engineers (IISE) is sponsoring the QCRE Track at the 2017 IISE Annual Conference. The IISE Annual conference is a forum for exchanging knowledge and discoveries in the industrial and systems engineering research and practice community.

As track chairs of the QCRE Track, we would like to encourage you to contribute to the conference by submitting an abstract. Authors of accepted abstracts will be invited to present their work in conference sessions. Each session will be 80 minutes and have 3 or 4 presenters. Abstracts are welcome in the following areas:

Reliability, Availability, Maintainability

Reliability Prediction, Modeling and Analysis

Physical Reliability Modeling

Reliability Growth Modeling

Degradation and Lifetime Testing

Accelerated Life Testing

Fault Tree and System Failure Analysis, FMEA

System Reliability and Optimization

Repairable Systems

Warranty Data Analysis

Data Mining

Distributed Sensing and Data Analysis

Safety and Risk Management

Decision Analysis and Risk


Quality Engineering and Applied Statistics

Quality Improvement in the Service Sector

Quality Planning and Management

Statistical Quality Control and Diagnosis

Six Sigma Methods and Process Capability

Statistical Process Control & Tolerancing

Design and Analysis of Experiments

Profiles and Multiple Responses

Multivariate and Bayesian Methods

Response Surface Methodology

Regression and Forecasting

Sampling and Inspection

Nonparametric Methods

Big Data in Quality and Reliability


Deadline for Abstract Submission is November 7, 2016. Abstracts are required to be between 100 and 200 words.

Note that the deadline is final and will not be extended.

Abstract submission site: https://urldefense.proofpoint.com/v2/url?u=https-3A__www.xcdsystem.com_iise_abstract_index.cfm-3FID-3DA3abIcc&d=CwIFAg&c=Ngd-ta5yRYsqeUsEDgxhcqsYYY1Xs5ogLxWPA_2Wlc4&r=Ue5eprQ_fMYcavWXDDYHbKQI0IFAmpjoy6QR5xcYCC4Qd5ukwoooDHsBFMkK-u0r&m=LXTYk_J10ArlDARL4VPYyrPTj9fPh5ANFgcXl2Esp54&s=9Xlv2I-nNVXN5OP9DhR6NALipg08oJv7_nv61V8vUNw&e= 

Conference web site: www.iienet.org/annual<https://urldefense.proofpoint.com/v2/url?u=http-3A__www.iienet.org_annual&d=CwIFAg&c=Ngd-ta5yRYsqeUsEDgxhcqsYYY1Xs5ogLxWPA_2Wlc4&r=Ue5eprQ_fMYcavWXDDYHbKQI0IFAmpjoy6QR5xcYCC4Qd5ukwoooDHsBFMkK-u0r&m=LXTYk_J10ArlDARL4VPYyrPTj9fPh5ANFgcXl2Esp54&s=diMvCLx13yVCzLPe4KWtjiBK4flJ7cxVVF20_IM_YCU&e= >

For more details refer to the attached file.


Kamran Paynabar (kamran.paynabar at isye.gatech.edu)<mailto:kamran.paynabar at isye.gatech.edu)>

Adel Alaeddini (Adel.Alaeddini at utsa.edu)<mailto:Adel.Alaeddini at utsa.edu)>

Pingfeng Wang (Pingfeng.Wang at wichita.edu)<mailto:Pingfeng.Wang at wichita.edu)>

Quality Control and Reliability Engineering Track Chairs
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