[Iefac.list] Technometrics Special Issue on System Informatics - Deadline Extended

[Yong Chen]

[Apologies for multiple postings]

The paper submission deadline for Technometrics Special Issue on System 
Informatics is extended from September 1, 2013 to *November 1, 2013*. 
This is the final deadline. No submission will be accepted after 
November 1, 2013.

*Call for Papers*

*System Informatics -- A Special Issue of /Technometrics/*

*Submission due date: November**1**, 20**13**.***

Recent advances in sensor and data capture technologies have led to 
massive amounts of data being collected routinely in the physical, 
chemical and engineering sciences. In addition to volume, the data have 
other complexities such as streaming data, images, network structure and 
so on. The advent of Big Data have led to a pressing need to develop 
sophisticated methodologies and tools that will enable: (i) the handling 
of the rich data streams of data obtained from complex engineering 
systems, (ii) the extraction of pertinent knowledge about the 
environmental and operational dynamics driving these systems, and (iii) 
combining the empirical information with domain knowledge for more 
enhanced design, analysis, and control of systems.

Addressing this need is very challenging due to an array of factors that 
include: the inherent complexity of the system itself, the uncertainty 
associated with the system's operation and its environment, the 
heterogeneity and the high dimensionality of the data communicated by 
the system, and the increasing expectations and requirements posed by 
real-time decision-making. We believe that neither conventional 
engineering-based modeling and analysis methods nor purely data-driven 
modeling techniques can effectively address those challenges in 
isolation. The effective and seamless integration of//physical and 
analytical models with data-driven methodologies is critical for 
improving the design, analysis, and control of complex systems. The term 
/System Informatics /has been recently used to characterize such an 
integrated framework. This special issue will publish original 
high-quality papers that deal with the development of new methodologies, 
innovative applications, or both.

We have listed below some examples to give potential authors some 
concrete ideas. However, these are meant to be indicative and are not by 
any means comprehensive.

·/Innovative system modeling:/Modeling and analysis methods that combine 
engineering knowledge (formal model, physical model, or empirical 
representation) with data to improve complex production or service systems;

·/Monitoring, diagnostics, and prognostics:/A holistic, system-level 
approach to monitoring, diagnosis, and prognostics that use integrated 
measures of functionalities and performance indices over the entire life 
cycle (quality, reliability, sustainability, etc.);

·/Planning and control:/Development of analytical frameworks, that 
integrate subject matter knowledge with empirical information, to 
facilitate design, planning and real-time control aiming at lead-time 
and productivity improvements.

The special issue will cover a broad range of application domains: 
hardware and software systems, production systems, energy systems, 
nano-manufacturing applications, transportation and communication 
networks, and service systems. In other words, papers in any application 
domain that fits within the broad scope of /Technometrics/ will be 
considered.

Papers must contain high-quality original contributions that deal with 
the development of new methodology and/or innovative applications. 
Papers must be prepared in accordance with the /Technometrics/ standards 
and guidelines.  Submitted papers should be orignal, not previously 
published, and not under consideration for publication elsewhere.  All 
papers will be reviewed following the regular review procedure of 
/Technometrics/.


*Paper Submission*

Please submit your manuscript through the on-line Manuscript Central at 
_http://mc.manuscriptcentral.com/amstat_. Please select "Special Issue" 
under Manuscript Type of your submission.  If you have difficulties, 
please contact Editorial Coordinator Ms. Janet Wallace at 
_technometrics.office at gmail.com <mailto:technometrics.office at gmail.com>_.

**

*Guest Editorial Board:*

**

Yong Chen**

Mechanical & Industrial Engineering,

University of Iowa

Iowa City, IA52242

yong-chen at uiowa.edu <mailto:yong-chen at uiowa.edu>**

	

Yu Ding

Industrial & Systems Engineering and
Electrical & Computer Engineering,

Texas A&M University

College Station, TX 77843, USA

yuding at iemail.tamu.edu <mailto:yuding at iemail.tamu.edu>**

V. Roshan Joseph

Industrial & Systems Engineering

Georgia Institute of technology

Altlanta, GA 30332

roshan at isye.gatech.edu <mailto:roshan at isye.gatech.edu>**

	

Vijay Nair

Statistics and Industrial & Operations Engineering

The University of Michigan

Ann Arbor, MI 48109

vnn at umich.edu <mailto:vnn at umich.edu>**

**


-- 
Yong Chen
Associate Professor
Dept. of Mechanical and Industrial Engineering
2138 Seamans Center
The University of Iowa
Iowa City, Iowa 52242-1527
Tel: 319-335-6106
Fax: 319-335-5669


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